Accurate testability analysis based-on multi-frequency test generation and a new testability metric

2007 IEEE North-East Workshop on Circuits and Systems, NEWCAS 2007

Volumn , Issue , 2007, Pages 1356-1359

  Abderrahman, A ^a   Savaria, Y ^a   Khouas, A ^a   Sawan, M ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG CIRCUITS; DESIGN FOR TESTABILITY; ESTIMATION; PLASMA DIAGNOSTICS; REAL TIME SYSTEMS;

ANALOG TESTING; DESIGN MODIFICATIONS; FAULT COVERAGE; MANUFACTURING COSTS; MASKING EFFECTS; MIXED-SIGNAL CIRCUITS; MULTI-FREQUENCY; PROCESS VARIATIONS; TEST ABILITY; TEST GENERATIONS; TEST PATTERN GENERATION; TEST QUALITY; TESTABILITY ANALYSIS;

TESTING;

EID: 50049116115     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NEWCAS.2007.4488018     Document Type: Conference Paper

References (20)

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