-
1
-
-
0032183635
-
A tutorial iintroduction,to research on analog and mixed-signal circuit testing
-
October
-
Linda Milor. A Tutorial Iintroduction,to Research on Analog and Mixed-Signal Circuit Testing IEEE Trans, on Circuits and Systems-II: Analog and Digital Signal Processing, 45(10): 1389-1407, October 1998.
-
(1998)
IEEE Trans, on Circuits and Systems-II: Analog and Digital Signal Processing
, vol.45
, Issue.10
, pp. 1389-1407
-
-
Milor, L.1
-
2
-
-
0003771081
-
-
Prentice HALL PTR. Upper Saddle River, NJ 07458
-
Bapiraju Vinnakota. Analog and Mixed-Signal Test. Prentice HALL PTR. Upper Saddle River, NJ 07458. 1998.
-
(1998)
Analog and Mixed-Signal Test
-
-
Vinnakota, B.1
-
3
-
-
0027831832
-
Fault-based automatic test generator for linear analog circuits
-
Naveena Nagi, Abhijit Chatterjee, Ashok Balivada, and Jacob A. Abraham. Fault-Based Automatic Test Generator for Linear Analog Circuits. In Proc IEEE International Conference on Computer-Aided-Design, pages 88-91, 1993.
-
(1993)
Proc. IEEE International Conference on Computer-Aided-Design
, pp. 88-91
-
-
Nagi, N.1
Chatterjee, A.2
Balivada, A.3
Abraham, J.A.4
-
4
-
-
0028706741
-
Fault detection and imput stimulus determination for the testing of analog integrated circuits based on power-supply current monitoring
-
Georges Gielen. Zhihua Wang, and Willy Sansen. Fault Detection and Imput Stimulus Determination for the Testing of Analog Integrated Circuits Based on Power-Supply Current Monitoring. In Proc. IEEE International Conference on Computer-Aided-Design. pages 495-498, 1999.
-
(1999)
Proc. IEEE International Conference on Computer-Aided-Design
, pp. 495-498
-
-
Gielen, G.1
Wang, Z.2
Sansen, W.3
-
6
-
-
0032684498
-
Test set selevtion for structural faults in analog ic's
-
July
-
Giri Devarayanadurg, Mani Soma, Prashant Goteti, and D. Huynh. Test set selevtion for structural faults in analog ic's IEEE Trans. Computer-Aided Design, 18(7):1026-1039, July 1999.
-
(1999)
IEEE Trans. Computer-Aided Design
, vol.18
, Issue.7
, pp. 1026-1039
-
-
Devarayanadurg, G.1
Soma, M.2
Goteti, P.3
Huynh, D.4
-
8
-
-
0033095170
-
Worst case tolerance analysis and clp-based multifrequency test generation for analog circuits
-
March
-
Abdessatar Abderrahman. Eduard Cerny and Bozena Kaminska. Worst case tolerance analysis and clp-based multifrequency test generation for analog circuits IEEE Trans. Computer-Aided Design. 18(3):332-345, March 1999.
-
(1999)
IEEE Trans. Computer-Aided Design
, vol.18
, Issue.3
, pp. 332-345
-
-
Abderrahman, A.1
Cerny, E.2
Kaminska, B.3
-
9
-
-
0033317248
-
Speed-up of high accurate analog test stimulus optimization
-
September
-
A. Khouas and A. Derieux. Speed-up of high accurate analog test stimulus optimization. In Proc. International Test Conference, pages 230-236. September 1999.
-
(1999)
Proc. International Test Conference
, pp. 230-236
-
-
Khouas, A.1
Derieux, A.2
-
10
-
-
84888046717
-
A third-order current-mode continuous-time sigma-delta modulator
-
September
-
H. Aboushady, M. Dessouky, E. de Lira Mendes, and P. Loumeau. A third-order current-mode continuous-time sigma-delta modulator. In Proc. IEEE International Conference on Electronics, Circuits, and Systems. September 1999.
-
(1999)
Proc. IEEE International Conference on Electronics, Circuits, and Systems
-
-
Aboushady, H.1
Dessouky, M.2
Mendes, L.E.3
Loumeau, P.4
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