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Volumn 4, Issue , 2001, Pages 17-20

FDP: Fault detection probability function for analog circuits

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG FAULT DETECTIONS; ANALOG INTEGRATED CIRCUIT; DECISION PROBLEMS; DETECTION PROBABILITIES; PHYSICAL PARAMETERS; PROCESS VARIATION; SIMULATED PERFORMANCE; TOLERANCE INTERVAL;

EID: 50049118538     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2001.922157     Document Type: Conference Paper
Times cited : (3)

References (11)
  • 1
    • 0032183635 scopus 로고    scopus 로고
    • A tutorial iintroduction,to research on analog and mixed-signal circuit testing
    • October
    • Linda Milor. A Tutorial Iintroduction,to Research on Analog and Mixed-Signal Circuit Testing IEEE Trans, on Circuits and Systems-II: Analog and Digital Signal Processing, 45(10): 1389-1407, October 1998.
    • (1998) IEEE Trans, on Circuits and Systems-II: Analog and Digital Signal Processing , vol.45 , Issue.10 , pp. 1389-1407
    • Milor, L.1
  • 2
    • 0003771081 scopus 로고    scopus 로고
    • Prentice HALL PTR. Upper Saddle River, NJ 07458
    • Bapiraju Vinnakota. Analog and Mixed-Signal Test. Prentice HALL PTR. Upper Saddle River, NJ 07458. 1998.
    • (1998) Analog and Mixed-Signal Test
    • Vinnakota, B.1
  • 4
    • 0028706741 scopus 로고    scopus 로고
    • Fault detection and imput stimulus determination for the testing of analog integrated circuits based on power-supply current monitoring
    • Georges Gielen. Zhihua Wang, and Willy Sansen. Fault Detection and Imput Stimulus Determination for the Testing of Analog Integrated Circuits Based on Power-Supply Current Monitoring. In Proc. IEEE International Conference on Computer-Aided-Design. pages 495-498, 1999.
    • (1999) Proc. IEEE International Conference on Computer-Aided-Design , pp. 495-498
    • Gielen, G.1    Wang, Z.2    Sansen, W.3
  • 8
    • 0033095170 scopus 로고    scopus 로고
    • Worst case tolerance analysis and clp-based multifrequency test generation for analog circuits
    • March
    • Abdessatar Abderrahman. Eduard Cerny and Bozena Kaminska. Worst case tolerance analysis and clp-based multifrequency test generation for analog circuits IEEE Trans. Computer-Aided Design. 18(3):332-345, March 1999.
    • (1999) IEEE Trans. Computer-Aided Design , vol.18 , Issue.3 , pp. 332-345
    • Abderrahman, A.1    Cerny, E.2    Kaminska, B.3
  • 9
    • 0033317248 scopus 로고    scopus 로고
    • Speed-up of high accurate analog test stimulus optimization
    • September
    • A. Khouas and A. Derieux. Speed-up of high accurate analog test stimulus optimization. In Proc. International Test Conference, pages 230-236. September 1999.
    • (1999) Proc. International Test Conference , pp. 230-236
    • Khouas, A.1    Derieux, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.