Parametric fault simulation and test vector generation

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2000, Pages 650-656

  Saab, Khaled ^a   Ben Hamida, Naim ^a   Kaminska, Bozena ^a  

^a Fluence Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAULTY CIRCUITS; LARGE DEVIATIONS; OUTPUT PARAMETERS; PARAMETRIC FAULT; PRINCIPAL COMPONENTS; PROCESS INFORMATION; PROCESS VARIATION; TEST VECTOR GENERATIONS;

EXHIBITIONS;

AUTOMATION;

EID: 0009615419     PISSN: 15301591     EISSN: None     Source Type: Journal    
DOI: 10.1109/DATE.2000.840855     Document Type: Article

References (9)

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2. Ben-Hamida N. And Kaminska B., "Analog Circuit Testing Based on Sensitivity Computation", IEEE International Test Conference, Baltimore, Oct. 1993, pp. 652-661.
3. K. Saab, D. Marche, Ben-Hamida N., B. Kaminska, "LIMSoft: Automated Tool For Sensitivity Analysis and Test Vector Generation", IEE Proceeding on Circuit Devices and Systems, Vol. 143, No. 6, Dec. 1996.
4. Slamani M., Kaminska B., "Testing Analog Circuit by Sensitivity Computation", European Design Automation Conference, EDAC’92, Bruxelles, March 1992, pp. 563-569.
5. Slamani M., Kaminska B., "Multifrequncy Testability Analysis for Analog Circuit", IEEE Trans. On Circuit and Systems, part II, feb 1996, pp. 134-139.
6. Ben-Hamida N., Saab K., Marche D. And Kaminska B., "FaultMaxx: A Perturbation Based Fault Modeling and Simulation for Mixed-Signal Circuits", Asien Test Conference. October 1997.
7. Manoj Sachdev, " A Realistic Defect Oriented Testability Methodology for Analog Circuits", Jetta 1994.
8. Naveena Nagi, Abhijit Cahtterjee, Jacob Abraham, "Fault Simulation of Linear Analog Circuits", Analog Integrated circuits and Signal Processing, 1993, pp. 245-260.
9. P. Yang, D.E. Hocevar, P.F. Cox, C. Machala, P.K. Chattergee. "An Integrated and Efficient Approach for MOS VLSI Statistical Circuit Design". IEEE Transaction on computer-aided design of integrated circuits and systems. Vol. CAD 5, No. 1, Jan. 1986.