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Volumn , Issue , 2007, Pages 153-156

Microvia fill ratio control

Author keywords

[No Author keywords available]

Indexed keywords

CELL GROWTH; CURRENT DENSITY; INDUSTRIAL ELECTRONICS; OPTIMIZATION; TECHNICAL PRESENTATIONS; VOLTAGE REGULATORS;

EID: 50049097563     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISIE.2007.4374590     Document Type: Conference Paper
Times cited : (3)

References (10)
  • 2
    • 84920357276 scopus 로고    scopus 로고
    • A method for microvia fill process modelling in a Cu-Cu-electrode system with electrolyte additives
    • unpublished
    • Pohjoranta A. and Tenno R., "A method for microvia fill process modelling in a Cu-Cu-electrode system with electrolyte additives," unpublished.
    • Pohjoranta, A.1    Tenno, R.2
  • 4
    • 0035300710 scopus 로고    scopus 로고
    • Copper Electrodeposition: Principles and Recent Progress
    • Reid J., "Copper Electrodeposition: Principles and Recent Progress," Jap. J. App. Phys., vol. 40, no. 4B, pp. 2650-2657, 2001.
    • (2001) Jap. J. App. Phys , vol.40 , Issue.4 B , pp. 2650-2657
    • Reid, J.1
  • 5
    • 0037048825 scopus 로고    scopus 로고
    • Influence of Additives on Cu Electrodeposition Mechanisms in Acid Solution: Direct Current Study Supported by Non-Electrochemical Measurements
    • Bonou L. and Eyraud M. and Denoyel R. and Massiani Y., "Influence of Additives on Cu Electrodeposition Mechanisms in Acid Solution: Direct Current Study Supported by Non-Electrochemical Measurements," El.chem. Acta, vol. 47, pp. 4139-4148, 2002.
    • (2002) El.chem. Acta , vol.47 , pp. 4139-4148
    • Bonou, L.1    Eyraud, M.2    Denoyel, R.3    Massiani, Y.4
  • 6
    • 0038608146 scopus 로고    scopus 로고
    • Additive Behavior During Copper Electrodeposition in Solutions Containing Cl-, PEG, and SPS
    • Tan M. and Harb J. N., "Additive Behavior During Copper Electrodeposition in Solutions Containing Cl-, PEG, and SPS," J. El. chem. Soc, vol. 150, no. 6, pp. C420-C425, 2003.
    • (2003) J. El. chem. Soc , vol.150 , Issue.6
    • Tan, M.1    Harb, J.N.2
  • 7
    • 30644480323 scopus 로고    scopus 로고
    • Curvature Enhanced Adsorbate Coverage Model for Electrodeposition
    • Moffat T. P. and Wheeler D. and Kim S.K. and Josell D., "Curvature Enhanced Adsorbate Coverage Model for Electrodeposition," J. El. chem. Soc, vol. 153, no. 2, pp. C127-C132, 2006.
    • (2006) J. El. chem. Soc , vol.153 , Issue.2
    • Moffat, T.P.1    Wheeler, D.2    Kim, S.K.3    Josell, D.4
  • 8
    • 10944220200 scopus 로고    scopus 로고
    • A Time-Dependent Transport-Kinetics Model for Additive Interactions in Copper Interconnect Metallization
    • Akolkar R. and Landau U., "A Time-Dependent Transport-Kinetics Model for Additive Interactions in Copper Interconnect Metallization," J. El. chem. Soc, vol. 151, no. 11, pp. C702-C711, 2004.
    • (2004) J. El. chem. Soc , vol.151 , Issue.11
    • Akolkar, R.1    Landau, U.2
  • 9
    • 0033906753 scopus 로고    scopus 로고
    • Theory of Filling High-Aspect Ratio Trenches and Vias in Presence of Additives
    • West A. C., "Theory of Filling High-Aspect Ratio Trenches and Vias in Presence of Additives," J. El. chem. Soc, vol. 147, no. 1, pp. 227-232, 2000.
    • (2000) J. El. chem. Soc , vol.147 , Issue.1 , pp. 227-232
    • West, A.C.1
  • 10
    • 0001324954 scopus 로고    scopus 로고
    • A Simple Equation for Predicting Superconformal Deposition in Submicrometer Trenches
    • Josell D. and Wheeler D. and Huber W.H. and Bonevich J.E. and Moffat T.P., "A Simple Equation for Predicting Superconformal Deposition in Submicrometer Trenches, J. El. chem. Soc, vol. 148, no. 12, pp.C767-C773, 2001.
    • (2001) J. El. chem. Soc , vol.148 , Issue.12
    • Josell, D.1    Wheeler, D.2    Huber, W.H.3    Bonevich, J.E.4    Moffat, T.P.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.