Adsorption of an organic zwitterion on a Si(1 1 1)-7 × 7 surface at room temperature

Surface Science

Volumn 602, Issue 16, 2008, Pages 2719-2723

  Makoudi, Younes ^a   Garah, Mohamed El ^a   Palmino, Frank ^a   Duverger, Eric ^a   Arab, Madjid ^a   Cherioux, Frederic ^a  

^a UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

Chirality; Scanning tunneling microscopy; Semiconductors; Surface chemistry; Zwitterions

Indexed keywords

ADSORPTION; SILICON;

A-STABILITY; CHIRALITY; EMPIRICAL MODELING; MOLECULAR ASSEMBLIES; ROOM TEMPERATURES; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTORS; STM IMAGES; SURFACE CHEMISTRY; ZWITTERIONS;

IMAGE ENHANCEMENT;

EID: 49849098419     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2008.06.003     Document Type: Article

References (40)

1. Joachim C., Gimzewski J.K., and Aviram A. Nature 408 (2000) 541
2. Lehn J.-M. Supramolecular Chemistry; Concepts and Perspectives (1995), WILEY-VCH, Weinheim
3. Barth J.V., Constantini G., and Kern K. Nature 437 (2005) 679
4. Theobald J.A., Oxtoby N.S., Philipps N.A., Champness N.R., and Beton P.H. Nature 424 (2003) 1029
5. Percec V., Glodde V.M., Bera T.K., Miura Y., Shiyanovskaya I., Singer K.D., Balagurusamy V.S.K., Heiney P.A., Schnell I., and Rapp I.A. Nature 419 (2002) 384
6. Arima V., Fabiano E., Blyth R.I.R., Della Sala F., Matino F., Thompson J., Cingolani R., and Rinaldi R. J. Am. Chem. Soc. 126 (2004) 16951
7. Vonau F., Aubel D., Bouteiller L., Reiter G., and Simon L. Phys. Rev. Lett. 99 (2007) 086103
8. Grill L., Dyer M., Lafferentz L., Persson M., Peters M.V., and Hecht S. Nat. Nano. 2 (2007) 687
9. Schiffrin A., Riemann A., Auwärter W., Penenc Y., Weber-Bargioni A., Cvetko D., Cossaro A., Morgante A., and Barth J.V. Proc. Natl. Acad. Sci. 104 (2007) 5279
10. Li S.-S., Yan H.-J., Wan L.-J., Yang H.-B., Northop B.H., and Stang P.J. J. Am. Chem. Soc. 129 (2007) 9268
11. Puigmarti J., Minoia A., Uji-i H., Rovira C., Cornil J., De Feyter S., Lazzaroni R., and Amabilino D.B. J. Am. Chem. Soc. 128 (2006) 12602
12. Samori P., Yin X., Tcheborareva N., Wang Z., Pakula T., Jäckel F., Watson M.D., Venturini A., Müllen K., and Rabe J.P. J. Am. Chem. Soc. 126 (2004) 3567
13. Bléger D., Kreher D., Mathevet F., Attias A.-J., Schull G., Huard A., Douillard L., Fiorini-Debuisschert C., and Charra F. Angew. Chem. Int. Ed. 46 (2007) 7404
14. Jäckel F., and Rabe J.P. In: Samori P. (Ed). Scanning Probe Microscopies Beyond Imaging (2006), WILEY-VCH, Weiheim 36-53 (Chapter 2)
15. Hamers R.J., Coulter S.K., Ellison M.D., Hovis J.S., Padowitz D.F., Schartz M.P., Greenlief C.M., and Russel J.N. Acc. Chem. Res. 33 (2000) 617
16. Sloan P.A., and Palmer R.E. Nature 434 (2005) 367
17. McNab I.R., and Polanyi J.C. Chem. Rev. 106 (2006) 4321
18. Baffou G., Mayne A.J., Comtet G., Dujardin G., Sonnet P., and Stauffer L. Appl. Phys. Lett. 91 (2007) 073101
19. Makoudi Y., Palmino F., Duverger E., Arab M., Cherioux F., Ramseyer C., Therrien B., Tschan M.J.-L., and Süss-Fink G. Phys. Rev. Lett. 100 (2008) 076405
20. Thibaudau F., Masson L., Chermam A., Roche J.R., and Salvan F. F. J. Vac. Sci. Technol. A 19 (1998) 2967
21. Palmino F., Pelletier S., Ehret E., Gauthier B., and Labrune J.-C. J. Vac. Sci. Technol. A 18 (2000) 2239
22. Makoudi Y., Arab M., Palmino F., Duverger E., and Cherioux F. J. Am. Chem. Soc. 130 (2008) 6670
23. Harikumar K.R., Polanyi J.C., Sloan P.A., Ayissi S., and Hofer W.A. J. Am. Chem. Soc. 128 (2006) 16791
24. Harikumar K.R., Lim T., McNab I.R., Polanyi J.C., Zotti L., Ayissi S., and Hofer W.A. Nat. Nano. 3 (2008) 222
25. Makoudi Y., Arab M., Palmino F., Duverger E., Ramseyer C., Picaud F., and Cherioux F. Angew. Chem. Int. Ed. 46 (2007) 9287
26. Serbutoviez C., Nicoud J.-F., Fisher J., Ledoux I., and Zyss J. Chem. Mater. 6 (1994) 1358
27. Kresse G., and Hafner J. Phys. Rev. B 47 (1993) 558
28. Kresse G., and Furthmüller J. Phys. Rev. B 54 (1996) 11169
29. Lopinski G.P., Moffat D.J., Wayner D.D.M., and Wolkow R.A. Nature 392 (1998) 909
30. Kim J.W. J. Am. Chem. Soc. 127 (2005) 5016
31. Kim J.W., Carbone M., Dil J.H., Tallarida M., Flammini R., Casaletto M.P., Horn K., and Piancastelli M.N. Phys. Rev. Lett. 95 (2005) 107601
32. Böhringer M., Morgentern K., Schneider W.D., Berndt R., Mauri F., Vita A.D., and Car R. Phys. Rev. Lett. 83 (1999) 324
33. Chen Q., and Richardson N.V. Prog. Surf. Sci. 73 (2003) 59
34. Böhringer M., Morgentern K., Schneider W.D., and Berndt R. Angew. Chem. Int. Ed. 38 (1999) 821
35. Spetanow S., Lin N., Payer D., Schlickum U., Klappenberger F., Zoppellaro G., Ruben M., Brune H., Barth J.V., and Kern K. Angew. Chem. Int. Ed. 46 (2007) 710
36. Pitters J.L., and Wolkow R.A. Nano Lett. 6 (2006) 390
37. Padowitz D.F., and Hamers R.J. J. Phys. Chem. B 102 (1998) 8541
38. Eguchi T., Fujikawa Y., Akiyama K., An T., Ono M., Hashimoto T., Morikawa Y., Terakura K., Sakurai T., Lagally M.G., and Hasegawa Y. Phys. Rev. Lett. 93 (2004) 266102
39. R.J. Hammers, STM on semiconductor, in: I.H.J. Güntherodt, R. Wiesendanger (Eds.), Scanning Tunneling Microscopy, Springer Ser. Surf. Sci., 20 (1992) 83.
40. Selloni A., Carnevali P., Tosatti E., and Chen C.D. Phys. Rev. B 31 (1985) 2602