CMOS output drivers with reduced ground bounce and electromagnetic emission

European Solid-State Circuits Conference

Volumn , Issue , 2003, Pages 537-540

  Deutschmann, B ^a   Ostermann, T ^b  

^a AMS AG   (Austria)

^b JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC EMISSIONS; GROUND BOUNCE; OUTPUT DRIVERS; SLEW RATE;

ELECTROMAGNETIC WAVE EMISSION;

ELECTROMAGNETIC DISPERSION;

EID: 49749152174     PISSN: 19308833     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSCIRC.2003.1257191     Document Type: Conference Paper

References (12)

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8. T. Ostermann, and B. Deutschmann,.,TEM-Cell and Surface Scan to Identify the Electromagnetic Emission of Integrated Circuits", Proc. 2003 Great Lakes Symposium on VLSI (GLSVLSI), April 2003, Washington, DC.
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10. IEC 61967-2: "Integrated circuits- Measurement of electromagnetic emissions, 150 kHz to 1 GHz- Part 2: Measurement of radiated emissions, TEM-cell method", status: work in progress, current document: 47A/619/NP
11. IEC 61967-1 Ed. 1. 0: "Integrated circuits-Measurement of electromagnetic emissions, 150 kHz to 1 GHz- Part 1: General conditions and definitions", Validity date: 31 December 2012
12. IEC 47A/552/NP, "Universal testboard for measurement of EMC of ICs", SC47A/WG9