Integrating RTL IPs into TLM designs through automatic transactor generation

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2008, Pages 15-20

  Bombieri, Nicola ^a   Deganello, Nicola ^a   Fummi, Franco ^a  

^a UNIVERSITY OF VERONA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ABSTRACTING; CHLORINE COMPOUNDS; INDUSTRIAL ENGINEERING; INTEGRATED CIRCUITS; TESTING;

ABSTRACTION LEVELS; AUTOMATICALLY GENERATED; DESIGN COMPLEXITIES; DESIGN FLOWS; DESIGN PRACTICES; ERROR-PRONE; SYSTEM COMPONENTS; TEST BENCHES; TRANSACTION-LEVEL-MODELING;

EMBEDDED SYSTEMS;

EID: 49749128752     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2008.4484653     Document Type: Conference Paper

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