Scalable sequential equivalence checking across arbitrary design transformations

IEEE International Conference on Computer Design, ICCD 2006

Volumn , Issue , 2006, Pages 259-266

  Baumgartner, Jason ^a   Mony, Hari ^a   Paruthi, Viresh ^a   Kanzelman, Robert ^a   Janssen, Geert ^b  

^a IBM   (United States)

^b IBM RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHLORINE COMPOUNDS; MATHEMATICAL TRANSFORMATIONS; NONMETALS; SEQUENTIAL CIRCUITS; SILICON; SOLUTIONS;

COMPUTER DESIGNS; HARDWARE DESIGNS; INDUSTRIAL DEMANDS; INITIAL STATES; INTERNATIONAL CONFERENCES; POST-SILICON DEBUG; SCALABLE SOLUTIONS; SEQUENTIAL EQUIVALENCE CHECKING;

DESIGN OF EXPERIMENTS;

EID: 49749112061     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCD.2006.4380826     Document Type: Conference Paper

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