STM study of titanium silicide nanostructure growth on Si(1 1 1)-(sqrt(19) × sqrt(19)) substrate

Applied Surface Science

Volumn 254, Issue 21, 2008, Pages 6948-6951

  Cegiel, M ^a   Bazarnik, M ^a   Biskupski, P ^b   Winiarz, S ^a   Gutek, J ^c   Bos A ^a   Suto, S ^d   Mielcarek, S ^b   Wawro, A ^e   Czajka, R ^a  

^a POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

^b ADAM MICKIEWICZ UNIVERSITY   (Poland)

^c CENTER OF ADVANCED EUROPEAN STUDIES AND RESEARCH CAESAR   (Germany)

^d TOHOKU UNIVERSITY   (Japan)

^e INSTITUTE OF PHYSICS   (Poland)

Author keywords

Nanostructures; Scanning tunneling microscopy; Scanning tunneling spectroscopy; Titanium silicide

Indexed keywords

ANNEALING; EVAPORATION; SCANNING TUNNELING MICROSCOPY; SILICIDES;

DEPOSITED MATERIALS; DIRECT HEATING; EVAPORATION TIME; NANO-ISLANDS; NANOSTRUCTURE GROWTH; POST DEPOSITION ANNEALING; SCANNING TUNNELING SPECTROSCOPY; TITANIUM SILICIDE;

NANOSTRUCTURES;

EID: 49549095982     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.001     Document Type: Article

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