Electrical levels of nanoscale NiSi2 precipitates in silicon band gap

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 4, Issue 8, 2007, Pages 3056-3060

  Trushin, M V ^a   Vyvenko, O F ^a  

^a ST PETERSBURG STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC LEVELS; EXTENDED DEFECTS; INTERNATIONAL CONFERENCES; NANO SCALING;

CRYSTALS; EXPLOSIVE ACTUATED DEVICES; SEMICONDUCTOR MATERIALS;

ELECTRIC CONDUCTIVITY;

EID: 49549087115     PISSN: 18626351     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssc.200775453     Document Type: Conference Paper

References (10)

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