|
Volumn 16, Issue , 2004, Pages 369-372
|
Normally-off operation power AlGaN/GaN HFET
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ELECTRIC BREAKDOWN;
FIELD EFFECT TRANSISTORS;
FREQUENCIES;
GALLIUM NITRIDE;
HETEROJUNCTIONS;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
SECONDARY ION MASS SPECTROMETRY;
SEMICONDUCTOR DOPING;
SUBSTRATES;
TRANSMISSION ELECTRON MICROSCOPY;
HETEROINTERFACES;
HETEROJUNCTION FIELD EFFECT TRANSISTORS (HEFT);
RECESS GATE STRUCTURES;
SHEET RESISTANCE;
SEMICONDUCTING ALUMINUM COMPOUNDS;
|
EID: 4944265144
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/wct.2004.240214 Document Type: Conference Paper |
Times cited : (66)
|
References (7)
|