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Volumn 16, Issue , 2004, Pages 319-322

A new vertical GaN Schottky barrier diode with floating metal ring for high breakdown voltage

Author keywords

[No Author keywords available]

Indexed keywords

ACETONE; ELECTRIC BREAKDOWN; GALLIUM NITRIDE; METHANOL; OPTIMIZATION; PARAMETER ESTIMATION; THERMAL CONDUCTIVITY;

EID: 4944261404     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (23)

References (8)
  • 3
    • 0001276713 scopus 로고    scopus 로고
    • High-voltage mesa-structure GaN Schottky rectifiers processed by dry and wet etching
    • T. G. Zhu, D. J. H. Lambert, B. S. Shelton, M. M. Wong, U. Chowdhury, and R. D. Dupuis, " High-voltage mesa-structure GaN Schottky rectifiers processed by dry and wet etching," Appl. Phys. Lett. Vol. 77, pp. 2918-2920, 2000
    • (2000) Appl. Phys. Lett. , vol.77 , pp. 2918-2920
    • Zhu, T.G.1    Lambert, D.J.H.2    Shelton, B.S.3    Wong, M.M.4    Chowdhury, U.5    Dupuis, R.D.6
  • 4
    • 0035275929 scopus 로고    scopus 로고
    • Schottky rectifiers fabricated on free-standing GaN substrates
    • J. W. Johnson, J. R. LaRoch, F. Ren, "Schottky rectifiers fabricated on free-standing GaN substrates," Solid State Electronics, 45, pp 405-410, 2001
    • (2001) Solid State Electronics , vol.45 , pp. 405-410
    • Johnson, J.W.1    Laroch, J.R.2    Ren, F.3
  • 8
    • 0032256580 scopus 로고    scopus 로고
    • Direct measurement of gate depletion in high breakdown (450V) AlGaN/GaN heterostructure field effect transistors
    • R. Vetury, et al., "Direct measurement of gate depletion in high breakdown (450V) AlGaN/GaN heterostructure field effect transistors," IEDM Technical Digest, pp 55-58, 1998
    • (1998) IEDM Technical Digest , pp. 55-58
    • Vetury, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.