Room temperature single ion detection with Geiger mode avalanche diode detectors

Applied Physics Letters

Volumn 93, Issue 4, 2008, Pages

  Seamons, J A ^a   Bielejec, E ^a   Carroll, M S ^a   Childs, K D ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHES (SNOWSLIDES); CHARGE COUPLED DEVICES; DETECTORS; DIODES; ION BEAM LITHOGRAPHY; IONS; LOGIC CIRCUITS; METALLIC COMPOUNDS; METALS; MOS DEVICES; NONMETALS; OPTICAL DESIGN; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMICONDUCTOR MATERIALS; SILICON; SNOW;

AVALANCHE PHOTO-DIODES; COMPLEMENTARY METAL OXIDE SEMICONDUCTORS; DETECTION EFFICIENCIES; DIODE DETECTORS; GEIGER MODES; GEIGER-MODE OPERATION; ION DETECTORS; ION STOPPING; NOISE FLOORS; ROOM TEMPERATURES; SILICON NANO-STRUCTURES; SINGLE ATOMS; SINGLE ELECTRONS; SINGLE ION DETECTION; SINGLE IONS;

AVALANCHE DIODES;

EID: 49149131636     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2967211     Document Type: Article

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