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Volumn 51, Issue 7, 2008, Pages 30-36

Integrating III-V on silicon for future transistor applications

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY EFFICIENCY; INTEGRATION; LITHOGRAPHY; NONMETALS; TRANSISTORS;

EID: 49149130027     PISSN: 0038111X     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article
Times cited : (8)

References (13)
  • 1
    • 3242671509 scopus 로고    scopus 로고
    • A 90nm High-Volume Manufacturing Logic Technology Featuring Novel 45nm Gate Length Strained Silicon CMOS Transistors
    • T. Ghani et al., "A 90nm High-Volume Manufacturing Logic Technology Featuring Novel 45nm Gate Length Strained Silicon CMOS Transistors," International Electron Devices Meeting (IEDM) Technical Digest, 2003, pp. 978-980.
    • (2003) International Electron Devices Meeting (IEDM) Technical Digest , pp. 978-980
    • Ghani, T.1
  • 2
    • 50249185641 scopus 로고    scopus 로고
    • A 45nm Logic Technology with High-k+Metal Gate Transistors, Strained Silicon, 9 Cu Interconnect Layers, 193nm Dry Patterning, and 100% Pb-free Packaging
    • K. Mistry et al., "A 45nm Logic Technology with High-k+Metal Gate Transistors, Strained Silicon, 9 Cu Interconnect Layers, 193nm Dry Patterning, and 100% Pb-free Packaging," International Electron Devices Meeting (IEDM) Technical Digest, 2007, pp. 247-250.
    • (2007) International Electron Devices Meeting (IEDM) Technical Digest , pp. 247-250
    • Mistry, K.1
  • 3
    • 37249061772 scopus 로고    scopus 로고
    • High-k/Ge MOSFETs for Future Nanoelectronics
    • Jan.-Feb
    • Y. Kamata, "High-k/Ge MOSFETs for Future Nanoelectronics," Materials Today, Vol. 11, No. 1-2, Jan.-Feb. 2008, pp. 30-38.
    • (2008) Materials Today , vol.11 , Issue.1-2 , pp. 30-38
    • Kamata, Y.1
  • 4
    • 33750585580 scopus 로고    scopus 로고
    • 85nm Gate Length Enhancement and Depletion Mode InSb Quantum Well Transistors for Ultra High Speed and Very Low Power Digital Logic Applications
    • S. Datta et al., "85nm Gate Length Enhancement and Depletion Mode InSb Quantum Well Transistors for Ultra High Speed and Very Low Power Digital Logic Applications," International Electron Devices Meeting (IEDM) Technical Digest, 2005, pp. 783-786.
    • (2005) International Electron Devices Meeting (IEDM) Technical Digest , pp. 783-786
    • Datta, S.1
  • 5
    • 34547620506 scopus 로고    scopus 로고
    • Heterogeneous InSb Quantum Well Transistors on Silicon for Ultra-high Speed, Low Power Logic Applications
    • July
    • T. Ashley et al., "Heterogeneous InSb Quantum Well Transistors on Silicon for Ultra-high Speed, Low Power Logic Applications," Electr. Lett., Vol. 43, No. 14, July 2007.
    • (2007) Electr. Lett , vol.43 , Issue.14
    • Ashley, T.1
  • 7
    • 49149131108 scopus 로고    scopus 로고
    • 0.3As Quantum Well Transistor on Silicon Substrate using Thin (<2um) Composite Buffer Architecture for High-Speed and Low-Voltage (0.5V) Logic Applications
    • 0.3As Quantum Well Transistor on Silicon Substrate using Thin (<2um) Composite Buffer Architecture for High-Speed and Low-Voltage (0.5V) Logic Applications," International Electron Devices Meeting (IEDM) Technical Digest, 2007, pp. 625-628.
    • (2007) International Electron Devices Meeting (IEDM) Technical Digest , pp. 625-628
    • Hudait, M.K.1
  • 8
    • 79956022434 scopus 로고    scopus 로고
    • Vertical Scaling of Carbon Nanotube Field-Effect Transistors Using Top Gate Electrodes
    • S.J. Wind et al., "Vertical Scaling of Carbon Nanotube Field-Effect Transistors Using Top Gate Electrodes," Appl. Phys. Lett., Vol. 80, 2002, pp. 3817-3819.
    • (2002) Appl. Phys. Lett , vol.80 , pp. 3817-3819
    • Wind, S.J.1
  • 9
    • 49149130850 scopus 로고    scopus 로고
    • Pionics: The Emerging Science and Technology of Graphene-based Nanoelectronics
    • W.A. de Heer et al., "Pionics: the Emerging Science and Technology of Graphene-based Nanoelectronics," IEDM Technical Digest, 2007, pp. 199-202.
    • (2007) IEDM Technical Digest , pp. 199-202
    • de Heer, W.A.1
  • 10
    • 84887496795 scopus 로고    scopus 로고
    • III-V on Silicon for Future High Speed and Ultra-Low Power Digital Applications: Challenges and Opportunities
    • Digest of Papers, 2008, pp
    • R. Chau, "III-V on Silicon for Future High Speed and Ultra-Low Power Digital Applications: Challenges and Opportunities," Compound Semiconductor Mantech, Digest of Papers, 2008, pp. 15-18.
    • Compound Semiconductor Mantech , pp. 15-18
    • Chau, R.1
  • 11
    • 34547141145 scopus 로고    scopus 로고
    • High mobility p-channel HFETs using strained Sb-based materials
    • July
    • J.B. Boos et al., "High mobility p-channel HFETs using strained Sb-based materials," Electronics Letters, Vol. 43, No. 15, July 2007.
    • (2007) Electronics Letters , vol.43 , Issue.15
    • Boos, J.B.1
  • 12
    • 34548268224 scopus 로고    scopus 로고
    • Observation of Two-dimensional Hole Gas with Mobility and Carrier Density Exceeding Those ofTwo-dimensional Electron Gas at Room Temperature in the SiGe Heterostructures
    • M. Myronov et al., "Observation of Two-dimensional Hole Gas with Mobility and Carrier Density Exceeding Those ofTwo-dimensional Electron Gas at Room Temperature in the SiGe Heterostructures," Appl. Phys. Left., Vol. 91, 2007, 082108.
    • (2007) Appl. Phys. Left , vol.91 , pp. 082108
    • Myronov, M.1
  • 13
    • 35748969089 scopus 로고    scopus 로고
    • Integrated Nanoelectronics for the Future
    • Nov
    • R. Chau et al., "Integrated Nanoelectronics for the Future," Nature Materials, Vol. 6, Nov. 2007, pp. 810-812.
    • (2007) Nature Materials , vol.6 , pp. 810-812
    • Chau, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.