Interface engineering and strain in YBa2Cu3O7-δ thin films

Phase Transitions

Volumn 81, Issue 7-8, 2008, Pages 703-716

  Huijben, Mark ^a   Koster, Gertjan ^a   Blank, Dave H A ^a   Rijnders, Guus ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Interface engineering; Strain; Superconductor thin film; Thin film growth

Indexed keywords

CHLORINE COMPOUNDS; ECOLOGY; ELECTRIC PROPERTIES; FILM PREPARATION; LATTICE MISMATCH; LIQUID PHASE EPITAXY; MOLECULAR BEAM EPITAXY; PHASE INTERFACES; PHASE TRANSITIONS; SOLIDS; SUBSTRATES; SURFACE PROPERTIES; TECHNOLOGY; THICK FILMS; THIN FILMS; VAPOR DEPOSITION;

ATOMIC LAYERS; COMPLEX GROWTH; DEPOSITION CONDITIONS; ELECTRICAL PROPERTIES; GROWING FILM; GROWTH STAGES; HETEROSTRUCTURES; INTERFACE ENGINEERING; LATTICE MISMATCHING; MULTI-LAYER STRUCTURES; SRTI O3 SUBSTRATES; STACKING SEQUENCES; STRAIN; STRUCTURAL PROPERTIES; SUBSTRATE PROPERTIES; SUBSTRATE SURFACES; SUBSTRATE-FILM INTERFACE; SUPERCONDUCTING PROPERTIES; SUPERCONDUCTOR THIN FILM; THIN FILM GROWTH; YBA2CU3O7;

FILM GROWTH;

EID: 49149099259     PISSN: 01411594     EISSN: 10290338     Source Type: Journal    
DOI: 10.1080/01411590802063769     Document Type: Article

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