Transmission electron microscopy on interface engineered superconducting thin films

IEEE Transactions on Applied Superconductivity

Volumn 13, Issue 2 III, 2003, Pages 2834-2837

  Bals, Sara ^a   Van Tendeloo, Gustaaf ^a   Rijnders, Guus ^b   Huijben, Mark ^b   Leca, Victor ^b   Blank, Dave H A ^b  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

High resolution electron microscopy; Interface structure; Superconducting thin films

Indexed keywords

EPITAXIAL GROWTH; INTERFACES (MATERIALS); STRONTIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM BARIUM COPPER OXIDES;

INTERFACE STRUCTURES;

SUPERCONDUCTING FILMS;

EID: 0042977271     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2003.812023     Document Type: Conference Paper

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