Strain-induced structural changes in thin YBa2Cu 3O7-x films on SrTiO3 substrates

Thin Solid Films

Volumn 449, Issue 1-2, 2004, Pages 133-137

  Vonk, V ^a   Van Reeuwijk, S J ^a,b   Dekkers, J M ^b   Harkema, S ^b   Rijnders, A J H M ^b   Graafsma, H ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Epitaxy; Phase transitions; Surface and interface states; X Ray diffraction

Indexed keywords

EPITAXIAL GROWTH; FILM GROWTH; HIGH TEMPERATURE EFFECTS; INTERFACES (MATERIALS); PHASE TRANSITIONS; PULSED LASER DEPOSITION; STRAIN MEASUREMENT; STRONTIUM COMPOUNDS; STRUCTURE (COMPOSITION); SUBSTRATES; SYNCHROTRON RADIATION; THICKNESS MEASUREMENT; X RAY DIFFRACTION ANALYSIS; YTTRIUM BARIUM COPPER OXIDES;

ORTHORHOMBIC STRUCTURES; SURFACE AND INTERFACE STATES;

THIN FILMS;

EID: 1042304393     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.10.037     Document Type: Article

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