Microstructure and strain relaxation in YBa2Cu3O7 epitaxial thin films

Thin Solid Films

Volumn 319, Issue 1-2, 1998, Pages 211-214

  Maurice, J L ^a   Durand, O ^a   Drouet, M ^a   Contour, J P ^a  

^a THALES   (France)

Author keywords

Dislocations; Epitaxial thin films; Microstructure; Strain relaxation

Indexed keywords

CRYSTAL MICROSTRUCTURE; DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; FILM GROWTH; INTERFACES (MATERIALS); OXIDE SUPERCONDUCTORS; RELAXATION PROCESSES; STRAIN; STRONTIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; YTTRIUM COMPOUNDS;

STRONTIUM TITANATE; YTTRIUM BARIUM COPPER OXIDE;

SUPERCONDUCTING FILMS;

EID: 0032047208     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)01124-3     Document Type: Article

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