Field-emission properties of carbon nanotubes grown on a submicron-sized tungsten tip in terms of various buffer layers

Diamond and Related Materials

Volumn 17, Issue 7-10, 2008, Pages 1826-1830

  Park, Chang Kyun ^a   Kim, Jong Pil ^a   Yun, Sung Jun ^a   Kim, Young Kwang ^a   Kim, Won ^a   Kim, Jong Uk ^b   Park, Jin Seok ^a  

^a Hanyang University   (South Korea)

^b Korea Electrotechnology Research Institute (KERI)   (South Korea)

Author keywords

Buffer materials; Carbon nanotubes; Field emission; Stability

Indexed keywords

ARCHITECTURAL ACOUSTICS; BOND STRENGTH (CHEMICAL); BUFFER LAYERS; CATALYSIS; CHEMICAL BONDS; ELECTRONS; EMISSION SPECTROSCOPY; HIGH RESOLUTION ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGING TECHNIQUES; MOLECULAR ORBITALS; MOLECULAR SPECTROSCOPY; NANOCOMPOSITES; NANOPORES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTECHNOLOGY; NANOTUBES; OPTICAL DESIGN; OPTICAL WAVEGUIDES; PHOTOELECTRON SPECTROSCOPY; QUANTUM CHEMISTRY; SPECTRUM ANALYSIS; TIN; TITANIUM COMPOUNDS; TITANIUM NITRIDE; TUNGSTEN; X RAY PHOTOELECTRON SPECTROSCOPY;

BUFFER MATERIALS; CARBON NANOTUBES (CNTS); CHEMICAL-; CNT EMITTERS; CRYSTALLINE STRUCTURES; EMISSION CHARACTERISTICS; EMISSION CURRENTS; FIELD EMISSION; FIELD EMITTERS; FIELD-EMISSION CHARACTERISTICS; FIELD-EMISSION PROPERTIES; FIELD-EMISSION SCANNING ELECTRON MICROSCOPY; STABILITY; STRUCTURAL PROPERTIES; SUB MICRONS; SURFACE MORPHOLOGIES; THRESHOLD FIELDS; TUNGSTEN TIP; X-RAY PHOTOELECTRON SPECTROSCOPY XPS;

CARBON NANOTUBES;

EID: 48849115641     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2008.01.105     Document Type: Article

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