Precise thermography of microsystems in the visible region using a standard CCD camera

Proceedings of IEEE Sensors

Volumn , Issue , 2007, Pages 926-929

  Teyssieux, Damien ^a   Thiery, Laurent ^a   Cretin, Bernard ^a   Briand, Danick ^b   De Rooij, Nicolaas F ^b  

^a FEMTO ST INSTITUTE   (France)

^b UNIVERSITY OF NEUCHÂTEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; DIGITAL CAMERAS; LAWS AND LEGISLATION; MICROSYSTEMS; NONMETALS; OPTICAL ENGINEERING; OPTICAL PROPERTIES; PLATINUM; REMOTE SENSING; SEMICONDUCTING CADMIUM TELLURIDE; SILICON; STANDARDS; THERMOGRAPHY (IMAGING); THERMOGRAPHY (TEMPERATURE MEASUREMENT);

CCD SENSORS; CHARACTERISATION; INFRARED THERMOGRAPHY; LOW COSTS; MICRO-HEATERS; MICROMACHINED; OPTICAL METHODS; SILICON BASED; SPATIAL RESOLUTION SR); STATIC AND DYNAMIC; VISIBLE REGIONS;

SENSORS;

EID: 48349094926     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSENS.2007.4388554     Document Type: Conference Paper

References (9)

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