A symbolic inject-and-evaluate paradigm for byzantine fault diagnosis

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 19, Issue 2, 2003, Pages 161-172

  Huang, Shi Yu ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Byzantine fault; Diagnosis; Symbolic simulation

Indexed keywords

BENCHMARKING; COMBINATORIAL CIRCUITS; FAILURE ANALYSIS; LOGIC CIRCUITS; TIME DOMAIN ANALYSIS;

BENCHMARK CIRCUITS; BYZANTINE FAULT DIAGNOSIS; LOGIC INTEGRATED CIRCUITS;

INTEGRATED CIRCUIT TESTING;

EID: 0037379321     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1022889623942     Document Type: Article

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