Test efficiency analysis and improvement of SOC test platforms

Proceedings of the Asian Test Symposium

Volumn , Issue , 2007, Pages 463-466

  Hsieh, Tong Yu ^a   Lee, Kuen Jong ^a   You, Jian Jhih ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

MICROPROCESSOR CHIPS; PROGRAMMABLE LOGIC CONTROLLERS; REMOTELY OPERATED VEHICLES;

MINIMAL AREA; SOC DESIGNS; SOC TESTING; TEST CYCLES; TEST EFFICIENCY; TEST PLATFORMS; TEST PROCEDURES; TEST STRUCTURES; TEST TIME;

TESTING;

EID: 48049087895     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2007.4388055     Document Type: Conference Paper

References (8)

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