An embedded processor based SOC test platform

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 2005, Pages 2983-2986

  Lee, Kuen Jong ^a   Chu, Chia Yi ^a   Hong, Yu Ting ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST EQUIPMENT; BOUNDARY SCAN; EMBEDDED PROCESSORS; MIXED SIGNAL; MIXED-SIGNAL CORES; SCAN-BASED TESTING; SOC TESTS; TEST ACCESS MECHANISM; TEST COST; TEST PLATFORMS; TEST PROCEDURES; TEST PROGRAM;

APPLICATION SPECIFIC INTEGRATED CIRCUITS; AUTOMATIC TESTING; DATA COMPRESSION; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS; PROGRAMMABLE LOGIC CONTROLLERS;

CONTROLLERS;

EID: 34548228153     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2005.1465254     Document Type: Conference Paper

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