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Volumn 69, Issue 8, 2008, Pages 2047-2056

Chemical spray pyrolysis deposition and characterization of p-type CuCr1-xMgxO2 transparent oxide semiconductor thin films

Author keywords

A. Thin film; B. Chemical synthesis; C. X ray diffraction; D. Electrical properties; D. Optical properties

Indexed keywords

CHEMICAL REACTIONS; CRACKING (CHEMICAL); PESTICIDES; PYROLYSIS; SPRAYING; THERMOGRAVIMETRIC ANALYSIS;

EID: 47949120497     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2008.03.007     Document Type: Article
Times cited : (71)

References (41)
  • 29
    • 47949099508 scopus 로고    scopus 로고
    • International Center for Diffraction Data, JCPSD, Swarthmore, PA, USA, JCPSD data references 00-034-0424 and 01-074-0983.
    • International Center for Diffraction Data, JCPSD, Swarthmore, PA, USA, JCPSD data references 00-034-0424 and 01-074-0983.
  • 32
    • 2442501289 scopus 로고    scopus 로고
    • T. Minami, H. Tanaka, T. Shimakawa, T. Miyata, Proc. SPIE 5274 (2004) 399-406.
    • T. Minami, H. Tanaka, T. Shimakawa, T. Miyata, Proc. SPIE 5274 (2004) 399-406.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.