Characterization of nano-layered multilayer coatings using modified Bragg law

Materials Characterization

Volumn 59, Issue 9, 2008, Pages 1285-1291

  Yang, Q ^a   Zhao, L R ^a  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

Low angle X ray diffraction; Modified Bragg Law; Modulation period; Nano layered multilayer

Indexed keywords

DIFFRACTION; MODULATION; MULTILAYERS; X RAY ANALYSIS; X RAY DIFFRACTION;

(E ,3E) PROCESS; MODIFIED BRAGG LAW; MULTI LAYER COATINGS; MULTI LAYER STRUCTURES; PRACTICAL APPROACH; REFLECTION PEAKS; RELIABLE METHOD; X RAY DIFFRACTION (XRD);

X RAY DIFFRACTION ANALYSIS;

EID: 47849122047     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2007.11.001     Document Type: Article

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