Size effect on the phase stability of nanostructures

Current Nanoscience

Volumn 4, Issue 2, 2008, Pages 179-200

  Jiang, Q ^a   Yang, C C ^a  

^a Jilin University   (China)

Author keywords

Nanocrystals; Phase diagram; Phase transition; Surface and interface; Thermodynamics

Indexed keywords

ACTIVATION ENERGY; ANTIFERROMAGNETISM; ATOMIC PHYSICS; ATOMS; DYNAMICS; FERROMAGNETIC MATERIALS; FERROMAGNETISM; GRAPHIC METHODS; LANTHANUM COMPOUNDS; MAGNETIC MATERIALS; MELTING; MELTING POINT; METAL MELTING; MULTILAYERS; NANOCRYSTALLINE ALLOYS; NANOCRYSTALS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTECHNOLOGY; PHASE DIAGRAMS; PHASE INTERFACES; PHASE STABILITY; SEMICONDUCTOR DOPING; THEOREM PROVING; THERMODYNAMICS;

ADJUSTABLE PARAMETERS; ANTIFERROMAGNETIC (AFM) TRANSITIONS; ATOMIC INTERACTIONS; BI LAYERS; BINARY PHASE DIAGRAMS; BINARY SOLUTIONS; CLASSICAL THERMODYNAMICS; COHESIVE ENERGIES; CRITICAL TEMPERATURES; DIFFUSION ACTIVATION ENERGY; DIFFUSION COEFFICIENTS; FERROELECTRIC TRANSITIONS; FERROMAGNETIC (FM) TRANSITIONS; INTERFACE CONDITIONS; MELTING ENTHALPY; MELTING ENTROPY; MELTING TEMPERATURE (TM); METALLIC MULTILAYERS (ML); NANO-METER REGIMES; NANO-METER-SCALE; SIZE DEPENDENCE; SIZE DEPENDENT MELTING; SIZE EFFECTS; SOLID TRANSITION; TRANSITION (JEL CLASSIFICATIONS:E52 ,E41 ,E31); TRANSITION DIAGRAMS; TRANSITION FUNCTIONS;

GLASS TRANSITION;

NANOCRYSTAL; NANOMATERIAL;

DIFFUSION; DIFFUSION COEFFICIENT; ENTHALPY; ENTROPY; FERROELECTRIC TRANSITION TEMPERATURE; FERROMAGNETIC ANTIFERROMAGNETIC TRANSITION TEMPERATURE; FERROMAGNETIC TRANSITION TEMPERATURE; GLASS TRANSITION TEMPERATURE; MELTING POINT; MOLECULAR STABILITY; MOLECULAR WEIGHT; NEEL TRANSITION TEMPERATURE; NUCLEAR ENERGY; PARTICLE SIZE; PHASE TRANSITION; PHYSICAL PHASE; PRIORITY JOURNAL; REVIEW; SOLID LIQUID TRANSITION; SOLID VAPOR TRANSITION; SUPERCONDUCTOR TRANSITION TEMPERATURE; TEMPERATURE DEPENDENCE; THERMODYNAMICS; TRANSITION TEMPERATURE;

EID: 47749091695     PISSN: 15734137     EISSN: None     Source Type: Journal    
DOI: 10.2174/157341308784340949     Document Type: Review

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