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Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 15, 2000, Pages 10548-10557

Size-dependent melting point depression of nanostructures: Nanocalorimetric measurements

(9) Zhang, M a Efremov, M Yu a Schiettekatte, F a Olson, E A a Kwan, A T a Lai, S L a Wisleder, T a Greene, J E a Allen, L H a

a University of Illinois at Urbana Champaign (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INDIUM; SILICON NITRIDE;

ARTICLE; CALORIMETRY; EVAPORATION; FILM; HEAT; MELTING POINT; MODEL; PARTICLE SIZE; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034667110 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.62.10548 Document Type: Article

Times cited : (437)

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