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Volumn , Issue , 2008, Pages 560-565

A 100MHz to IGHz, 0.35V to 1.5V supply 256 × 64 SRAM block using symmetrized 9T SRAM cell with controlled read

Author keywords

[No Author keywords available]

Indexed keywords

65NM TECHNOLOGY; ACTIVE MODE (AM); ADDRESS DECODERS; BIT LINE (BL); BODY BIASING; CUT-OFF; DYNAMIC VOLTAGES; FREQUENCY RANGING; INTERNATIONAL CONFERENCES; LEAKAGE ENERGIES; LOW-VOLTAGE (LV); NMOS TRANSISTORS; NOISE MARGIN (NM); OPERATING FREQUENCIES; REDUCING POWER; SRAM CELLS; STANDBY MODES; STATIC NOISE MARGIN (SNM); TOTAL ENERGIES; VLSI DESIGNS; VOLTAGE DROPS;

EID: 47649109815     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSI.2008.89     Document Type: Conference Paper
Times cited : (21)

References (12)
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  • 2
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    • JAN
    • K.Takeda et. al., "A Read-Static-Noise-Margin-Free SRAM Cell for Low- VDD and High-Speed Applications", IEEE JSSC, VOL. 41, NO. 1, JAN. 2006
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  • 3
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    • Delay and Power Monitoring Schemes for Minimizing Power Consumption by Means of Supply and Threshold Voltage Control in Active and Standby Modes
    • APRIL
    • M.Nomura et. al "Delay and Power Monitoring Schemes for Minimizing Power Consumption by Means of Supply and Threshold Voltage Control in Active and Standby Modes" IEEEJSSC, VOL. 41, NO. 4, APRIL 2006
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    • Nomura, M.1
  • 4
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    • MAR
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  • 5
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    • JAN
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    • AUG
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  • 7
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    • JUNE
    • L. Chang et al., "Stable SRAM cell design for the 32 nm node and beyond," in Symp. VLSI Tech. Dig., JUNE. 2005, pp. 128-129.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.