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1
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0034986236
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Effect of Ag content on properties of Sn-Ag binary alloy solder
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Suganuma, K., Huh, S.-H., Kim, K., Nakase, H. and Nakamura, Y., Effect of Ag Content on Properties of Sn-Ag Binary Alloy Solder, Material Transactions JIM, Vol.42, No.2 (2001), pp.286-291.
-
(2001)
Material Transactions JIM
, vol.42
, Issue.2
, pp. 286-291
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-
Suganuma, K.1
Huh, S.-H.2
Kim, K.3
Nakase, H.4
Nakamura, Y.5
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2
-
-
0000019775
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Intermetallic compound formation of Sn/Pb, Sn/Ag, and Sn solders on Ni substrate from the molten stage and its growth during aging
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ASME
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Pan, T., Blair, H.D., Nicholson, J.M. and Oh, S., Intermetallic Compound Formation of Sn/Pb, Sn/Ag, and Sn Solders on Ni Substrate from the Molten Stage and Its Growth during Aging, Advances in Electronic Packaging, ASME, Vo1.2 (1997), pp. 1347-1355.
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(1997)
Advances in Electronic Packaging
, vol.2
, pp. 1347-1355
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-
Pan, T.1
Blair, H.D.2
Nicholson, J.M.3
Oh, S.4
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3
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0029325977
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Plastic deformation kinetics of 95.5Sn4CuO.5Ag solder joints
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Guo, Z., Pao, Y. and Conrad, H., Plastic Deformation Kinetics of 95.5Sn4CuO.5Ag Solder Joints, Trans. ASME Journal of Electronic Packaging, Vol.117 (1995), pp. 100-104.
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(1995)
Trans. ASME Journal of Electronic Packaging
, vol.117
, pp. 100-104
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-
Guo, Z.1
Pao, Y.2
Conrad, H.3
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4
-
-
0032288490
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Microstructure changes in Sn-3.5Ag solder alloy during creep
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Igoshev, VI., Kleiman, J.I., Shangguan, D., Lock, C., Wong, S. and Wiseman, M., Microstructure Changes in Sn-3.5Ag Solder Alloy during Creep, J. Electronic Materials, Vo1.27, No. 12 (1998), pp.1367-1371
-
(1998)
J. Electronic Materials
, vol.27
, Issue.12
, pp. 1367-1371
-
-
Igoshev, V.I.1
Kleiman, J.I.2
Shangguan, D.3
Lock, C.4
Wong, S.5
Wiseman, M.6
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5
-
-
0032154902
-
Modelling the creep rates of eutectic Bi-Sn solder using the data from its constitutive phases
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Raeder, C.H., Mitlin, D. and Messler, R.W., Jr., Modelling the Creep Rates of Eutectic Bi-Sn Solder Using the Data from Its constitutive Phases, J. Materials Science, Vo1.33 (1998), pp.4503-4508.
-
(1998)
J. Materials Science
, vol.33
, pp. 4503-4508
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-
Raeder, C.H.1
Mitlin, D.2
Messler Jr., R.W.3
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6
-
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0035492687
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Experimental and numerical verification of fatigue life estimation for solder bumps
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Ser. A
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Mukai, M., Takahashi, H., Kawakami, T., Takahashi, K., Iwasaki, K., Kishimoto, K. and Shibuya, T., Experimental and Numerical Verification of Fatigue Life Estimation for Solder Bumps, JSME Int. J., Ser. A, Vol.44, No.4 (2001), pp.567-572.
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(2001)
JSME Int. J.
, vol.44
, Issue.4
, pp. 567-572
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-
Mukai, M.1
Takahashi, H.2
Kawakami, T.3
Takahashi, K.4
Iwasaki, K.5
Kishimoto, K.6
Shibuya, T.7
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7
-
-
0031342784
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Thermomechanical response of materials and interfaces in electronic packaging: Part I - unified constitutive model and calibration
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Desai, C.S., Chia, J., Kundu, T. and Prince, J.L., Thermomechanical Response of Materials and Interfaces in Electronic Packaging: Part I - Unified Constitutive Model and Calibration, ASME Journal of Electronic Packaging, Vol. 119 (1997), pp.294-300.
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(1997)
ASME Journal of Electronic Packaging
, vol.119
, pp. 294-300
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-
Desai, C.S.1
Chia, J.2
Kundu, T.3
Prince, J.L.4
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8
-
-
0031337987
-
Thermomechanical response of materials and interfaces in electronic packaging: Part II - unified constitutive models, validation, and design
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Desai, C.S., Chia, J., Kundu, T. and Prince, J.L., Thermomechanical Response of Materials and Interfaces in Electronic Packaging: Part II - Unified Constitutive Models, Validation, and Design, ASME Journal of Electronic Packaging, Vol. 119 (1997), pp.301-309.
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(1997)
ASME Journal of Electronic Packaging
, vol.119
, pp. 301-309
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-
Desai, C.S.1
Chia, J.2
Kundu, T.3
Prince, J.L.4
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9
-
-
0032626766
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Modeling the deformation behavior of a Sn-Pb solder alloy using the simplified viscoplasticity theory based on overstress (VBO)
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ASME
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Maciucescu, L., Sham, T.-L. and Krempl, E., Modeling the Deformation Behavior of a Sn-Pb Solder Alloy Using the Simplified Viscoplasticity Theory Based on Overstress (VBO), ASME, Journal of Electronic Packaging, Vol. 121 (1999), pp.92-97.
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(1999)
Journal of Electronic Packaging
, vol.121
, pp. 92-97
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-
Maciucescu, L.1
Sham, T.-L.2
Krempl, E.3
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10
-
-
0242414730
-
Implicit integration and consistent tangent modulus of a time-dxependent non-unified constitutive model
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Kobayashi, M., Mukai, M., Takahashi, H., Ohno, N. and Kawakami, T., Implicit Integration and Consistent Tangent Modulus of a Time-Dependent Non-Unified Constitutive Model, International Journal for Numerical Method in Engineering, Vol.58 (2003), pp.1523-1543.
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(2003)
International Journal for Numerical Method in Engineering
, vol.58
, pp. 1523-1543
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-
Kobayashi, M.1
Mukai, M.2
Takahashi, H.3
Ohno, N.4
Kawakami, T.5
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11
-
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0348108171
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Elastic-plastic simulation of Pb/Sn solder alloys by separation of plastic and creep
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Ser. A
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Ohguchi, K. and Sasaki, K., Elastic-Plastic Simulation of Pb/Sn Solder Alloys by Separation of Plastic and Creep, JSME Int. J., Ser. A, Vo1.46, No.4 (2003), pp.559-566.
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(2003)
JSME Int. J.
, vol.46
, Issue.4
, pp. 559-566
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Ohguchi, K.1
Sasaki, K.2
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13
-
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0034844956
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Description of temperature dependence and creep deformation of 60Sn-40Pb solder alloys
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Ser. A
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Ohguchi, K. and Sasaki, K., Description of Temperature Dependence and Creep Deformation of 60Sn-40Pb Solder Alloys, JSME Int. J., Ser. A, Vol.44, No.1 (2001), pp.82-88.
-
(2001)
JSME Int. J.
, vol.44
, Issue.1
, pp. 82-88
-
-
Ohguchi, K.1
Sasaki, K.2
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14
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0041905237
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Viscoplastic deformation of 40Pb/6OSn solder alloys - experiments and constitutive modeling 14
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Sasaki, K., Ohguchi, K. and Ishikawa, H., Viscoplastic Deformation of 40Pb/6OSn Solder alloys - Experiments and Constitutive Modeling, ASME Journal of Electronic Packaging, Vol.123 (2001), pp.379-387.
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(2001)
ASME Journal of Electronic Packaging
, vol.123
, pp. 379-387
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Sasaki, K.1
Ohguchi, K.2
Ishikawa, H.3
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