Functionalization of atomic force microscope tips by dielectrophoretic assembly of Gd2O3:Eu3+ nanorods

Nanotechnology

Volumn 19, Issue 29, 2008, Pages

  Macedo, Andreia G ^a   Ananias, Duarte ^a   André, Paulo S ^a,b   Sá Ferreira, Rute A ^a   Kholkin, Andrei L ^a   Carlos, Luís D ^a   Rocha, J ^a  

^a UNIVERSITY OF AVEIRO   (Portugal)

^b UNIVERSITY OF AVEIRO   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; EUROPIUM; EXTREME ULTRAVIOLET LITHOGRAPHY; GADOLINIUM; MICROSCOPIC EXAMINATION; SCANNING PROBE MICROSCOPY;

ATOMIC FORCE MICROSCOPE (AFM); ATOMIC FORCE MICROSCOPY (AFM); DIELECTROPHORETIC ASSEMBLY; FUNCTIONALIZATION;

IMAGING TECHNIQUES;

GADOLINIUM; METHACRYLIC ACID; NANOROD; OXIDE; SILICON; SILOXANE;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTROPHORESIS; PHOTOLUMINESCENCE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; TOPOGRAPHY; WORK ENVIRONMENT;

EID: 47249165521     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/29/295702     Document Type: Article

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