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Volumn 87, Issue 12, 2005, Pages 1-3

Magnetic nanowire based high resolution magnetic force microscope probes

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTROPHORESIS; MAGNETIC FORCE MICROSCOPE; NANOWIRE-BASED PROBES;

ATOMIC FORCE MICROSCOPY; COBALT; ELECTROPHORESIS; MAGNETIC PROPERTIES; NICKEL;

NANOSTRUCTURED MATERIALS;

EID: 28344449369 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2043237 Document Type: Article

Times cited : (30)

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