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Volumn 17, Issue 4, 2008, Pages 580-585

Relationship between crystalline structure and hardness of Ti-Si-N-O coatings fabricated by dc sputtering

Author keywords

Crystalline; Hardness; TiSiNO; XRD

Indexed keywords

AISI D2; AREA RATIOS; ARGON FLOW; CHEMICAL COMPOSITIONS; CRYSTALLINE STRUCTURES; DC SPUTTERING; ELASTIC RECOVERY; HARDNESS TESTS; NANOINDENTATION TESTING; REACTIVE ATMOSPHERES; REACTIVE MAGNETRON CO-SPUTTERING; SILICON (111) SUBSTRATES; STRUCTURAL CHANGES; SUBSTRATE TEMPERATURE (ST); TI-SI-N; X RAY DIFFRACTION (XRD); X-RAY ENERGY DISPERSIVE SPECTROSCOPY (XEDS); YOUNG'S MODULUS (IGC: E14/K14);

EID: 47249123028     PISSN: 10599495     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11665-007-9141-0     Document Type: Article
Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.