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Volumn 51, Issue SUPPL. 2, 2007, Pages

Electrode dependence of resistance switching in NiO thin films

Author keywords

Current voltage measurement; NiO; Resistance switching

Indexed keywords


EID: 36348972371     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (8)

References (11)
  • 9
    • 36349013476 scopus 로고    scopus 로고
    • M. Wagner, T. Wagner, D. L. Carroll, J. Marien, D. A. Bonnell and M. Ruhle, Mater. Res. Soc. Bull. Aug. 42 (1997).
    • M. Wagner, T. Wagner, D. L. Carroll, J. Marien, D. A. Bonnell and M. Ruhle, Mater. Res. Soc. Bull. Aug. 42 (1997).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.