Influence of thermal annealing on optical properties and surface morphology of NiOx thin films

Materials Letters

Volumn 61, Issue 11-12, 2007, Pages 2482-2485

  Zhou, Ying ^a   Geng, Yongyou ^a   Gu, Donghong ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

Author keywords

Annealing; NiOx films; Optical properties; Optical recording; Surface morphology

Indexed keywords

ANNEALING; MAGNETRON SPUTTERING; NICKEL OXIDE; OPTICAL BAND GAPS; OPTICAL PROPERTIES; OPTICAL RECORDING; SCANNING ELECTRON MICROSCOPY; SURFACE MORPHOLOGY; X RAY PHOTOELECTRON SPECTROSCOPY;

ANNEALING TEMPERATURE; OPTICAL MEASUREMENT;

THIN FILMS;

EID: 34147172115     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2006.09.041     Document Type: Article

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