Experimental method to determine the absolute efficiency curve of a wavelength dispersive spectrometer

Microscopy and Microanalysis

Volumn 14, Issue 4, 2008, Pages 306-314

  Trincavelli, Jorge ^a   Limandri, Silvina ^a   Carreras, Alejo ^a,b   Bonetto, Rita ^a,c  

^a UNIVERSIDAD NACIONAL DE CÓRDOBA   (Argentina)

^b UNIVERSIDAD NACIONAL DE SAN LUIS   (Argentina)

^c DEPARTAMENTO DE QUÍMICA   (Argentina)

Author keywords

Detection efficiency; Electron probe microanalysis; Standardless microanalysis; Wavelength dispersive X ray spectrometer

Indexed keywords

EID: 46749149295     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608080379     Document Type: Article

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