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Volumn 31, Issue 2, 2002, Pages 184-187

Optimization of K-shell intensity ratios in electron probe microanalysis

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; PROBES; X RAY DIFFRACTION;

EID: 0036104453     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.566     Document Type: Article
Times cited : (8)

References (15)
  • 12
    • 0004326059 scopus 로고
    • International Union of Crystallography, Oxford University Press: Oxford
    • Young R. The Rietveld Method. International Union of Crystallography, Oxford University Press: Oxford; 1993.
    • (1993) The Rietveld Method
    • Young, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.