Asymmetry of characteristic X-ray peaks obtained by a Si(Li) detector

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 62, Issue 5, 2007, Pages 492-498

  Visñovezky, Claudia ^a   Limandri, Silvina ^a   Canafoglia, María Elena ^b   Bonetto, Rita ^b,c   Trincavelli, Jorge ^a,c  

^a UNIVERSIDAD NACIONAL DE CÓRDOBA   (Argentina)

^b DEPARTAMENTO DE QUÍMICA   (Argentina)

^c Facultad de Ciencias Naturales e Instituto M Lillo   (Argentina)

Author keywords

Peak asymmetry; Si(Li) detector; Spectral deconvolution; Spectral fitting

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL IMPURITIES; CRYSTAL STRUCTURE; X RAY ANALYSIS;

PEAK ASYMMETRY; SI(LI) DETECTOR; SPECTRAL DECONVOLUTION; SPECTRAL FITTING;

SILICON DETECTORS;

EID: 34347269212     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2007.05.005     Document Type: Article

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