Optimization of wavelength dispersive x-ray spectrometry analysis conditions

Journal of Research of the National Institute of Standards and Technology

Volumn 107, Issue 6, 2002, Pages 497-502

  Reed, Stephen J B ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Background; Optimization; Overlaps; Virtual WDS; Wavelength dispersive x ray analysis; Wavelength dispersive x ray spectrometers

Indexed keywords

COMPUTER AIDED ANALYSIS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; MICROANALYSIS; OPTIMIZATION;

X-RAY SPECTROMETRY;

X RAY SPECTROMETERS;

EID: 0036874804     PISSN: 1044677X     EISSN: None     Source Type: Journal    
DOI: 10.6028/jres.107.042     Document Type: Conference Paper

References (14)

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