Absolute determination of characteristic X-ray yields with a wavelength-dispersive spectrometer

Microchimica Acta

Volumn 155, Issue 1-2, 2006, Pages 199-204

  Merlet, Claude ^a   Llovet, Xavier ^b  

^a UNIV MONTPELLIER   (France)

^b UNIVERSITY OF BARCELONA   (Spain)

Author keywords

Absolute intensity; Monte Carlo simulation; PENELOPE; Wavelength dispersive spectrometer; X ray yield

Indexed keywords

EID: 33748550361     PISSN: 00263672     EISSN: 14365073     Source Type: Journal    
DOI: 10.1007/s00604-006-0543-8     Document Type: Conference Paper

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