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Volumn , Issue , 2007, Pages 244-249
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Tolerance to small delay defects by adaptive clock stretching
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Author keywords
[No Author keywords available]
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Indexed keywords
ASYNCHRONOUS SEQUENTIAL LOGIC;
BENCHMARKING;
CLOCKS;
DEFECTS;
DIES;
EIGENVALUES AND EIGENFUNCTIONS;
ELECTRIC POWER SUPPLIES TO APPARATUS;
INTEGRATED CIRCUIT TESTING;
PIPELINES;
SULFATE MINERALS;
TIMING CIRCUITS;
(+ MOD 2N) OPERATION;
BRIDGING DEFECTS;
CIRCUIT DELAYS;
CLOCK GATING;
CLOCK PERIODS;
CLOCK STRETCHING;
COMPUTATION TIME;
CONVENTIONAL DESIGNS;
CRITICAL PATHS;
DELAY DEFECTS;
DELAY SPREAD (DS);
DELAY VARIATIONS;
DUAL VTH;
GOOD YIELDS;
HANDSHAKING;
IN ORDER;
INTERNATIONAL (CO);
LOW-POWER DESIGNS;
MANUFACTURING DEFECTS;
MCNC BENCHMARKS;
NANOSCALED;
NEW DESIGN;
NON-LINEAR;
ON LINE TESTING;
PARAMETER FLUCTUATIONS;
PARAMETRIC VARIATIONS;
PARAMETRIC YIELD;
PATH DELAY (PD);
PERFORMANCE ANALYSES;
SIMPLESCALAR;
SIMULATION RESULTS;
TIMING SLACK;
VOLTAGE-SCALING;
NETWORKS (CIRCUITS);
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EID: 46749135215
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/IOLTS.2007.67 Document Type: Conference Paper |
Times cited : (5)
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References (14)
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