메뉴 건너뛰기




Volumn 85, Issue 7, 2008, Pages 1629-1638

Copper cleaning in supercritical CO2 for the microprocessor interconnects

Author keywords

Diketones; Copper; Pitting corrosion; Post etch cleaning; Supercritical carbon dioxide

Indexed keywords

CLEANING; COPPER; CORROSION PREVENTION; MULTIPROCESSING SYSTEMS; PITTING;

EID: 46549090058     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2008.03.018     Document Type: Article
Times cited : (18)

References (33)
  • 1
    • 46549084969 scopus 로고    scopus 로고
    • Semiconductor Industry Association, International Technology Roadmap for Semiconductors, 2003. Available from: .
    • Semiconductor Industry Association, International Technology Roadmap for Semiconductors, 2003. Available from: .
  • 4
    • 8644246782 scopus 로고    scopus 로고
    • M.R. Baklanov, Q.T. Le, E. Kesters, F. Iacopi, J. Van Aelst, H. Struyf, W. Boullart, K. Vanhaelemeersch, K. Maex, in: Interconnect Technology Conference, San Francisco, USA, June 7-9, 2004, Proceedings of the IEEE 2004 International, 2004, p. 187.
    • M.R. Baklanov, Q.T. Le, E. Kesters, F. Iacopi, J. Van Aelst, H. Struyf, W. Boullart, K. Vanhaelemeersch, K. Maex, in: Interconnect Technology Conference, San Francisco, USA, June 7-9, 2004, Proceedings of the IEEE 2004 International, 2004, p. 187.
  • 13
    • 3042826841 scopus 로고    scopus 로고
    • C. Millet, J. Daviot, A. Danel, V. Perrut, F. Tardif, L. Broussous, O. Renault, in: J. Ruzyllo, T. Hattori, R.L. Opila, R.E. Novak (Eds.), International Symposium on Cleaning Technology in Semiconductors Device Manufacturing VIII, Orlando, USA, October, 2003, Proceedings, vol. 26, 2003, p. 271.
    • C. Millet, J. Daviot, A. Danel, V. Perrut, F. Tardif, L. Broussous, O. Renault, in: J. Ruzyllo, T. Hattori, R.L. Opila, R.E. Novak (Eds.), International Symposium on Cleaning Technology in Semiconductors Device Manufacturing VIII, Orlando, USA, October, 2003, Proceedings, vol. 26, 2003, p. 271.
  • 15
    • 46549083758 scopus 로고    scopus 로고
    • V. Perrut, J.-Y. Clavier, S. Lazure, A. Danel, C. Millet, in: International Symposium on Supercritical Fluids, Versailles, France, April 28-30, 2003, Proceedings of the 6th International Symposium on Supercritical Fluids, 2003, p. 205.
    • V. Perrut, J.-Y. Clavier, S. Lazure, A. Danel, C. Millet, in: International Symposium on Supercritical Fluids, Versailles, France, April 28-30, 2003, Proceedings of the 6th International Symposium on Supercritical Fluids, 2003, p. 205.
  • 17
    • 46549084896 scopus 로고    scopus 로고
    • D. Rébiscoul, L. Broussous, D. Louis, G. Passemard, in: J. Ruzyllo, T. Hattori, R.E. Novak (Eds), International Symposium Cleaning Technology in Semiconductors Device Manufacturing IX, Electrochem. Soc. Tans., vol. 1, 2006, p. 365.
    • D. Rébiscoul, L. Broussous, D. Louis, G. Passemard, in: J. Ruzyllo, T. Hattori, R.E. Novak (Eds), International Symposium Cleaning Technology in Semiconductors Device Manufacturing IX, Electrochem. Soc. Tans., vol. 1, 2006, p. 365.
  • 18
    • 46549087946 scopus 로고    scopus 로고
    • Ober, Firefx4c_6: raymond.ober@college-de-france.fr.
    • Ober, Firefx4c_6: raymond.ober@college-de-france.fr.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.