Determination of the thickness and optical constants of amorphous silicon

Journal of Physics E: Scientific Instruments

Volumn 16, Issue 12, 1983, Pages 1214-1222

  Swanepoel, R ^a  

^a UNIVERSITY OF JOHANNESBURG   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR MATERIALS - OPTICAL PROPERTIES;

SEMICONDUCTING SILICON;

EID: 0020940620     PISSN: 00223735     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3735/16/12/023     Document Type: Article

References (10)