Surface resistivity estimation by scanning surface potential microscopy

Review of Scientific Instruments

Volumn 79, Issue 6, 2008, Pages

  Rakocevic, Z ^a   Popovic, N ^a   Bogdanov, Z ^a   Goncic, B ^a   Strbac, S ^b  

^a Laboratory for Atomic Physics   (Serbia)

^b UNIVERSITY OF BELGRADE   (Serbia)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; FILM THICKNESS; INERT GASES; NICKEL; NITROGEN; SPUTTERING; THICK FILMS;

ARGON ATMOSPHERES; SCANNING SURFACE POTENTIAL MICROSCOPY (SSPM); SURFACE RESISTIVITY; THIN FILM THICKNESSES;

SURFACE POTENTIAL;

EID: 46449112477     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2937647     Document Type: Article

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