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Volumn 56, Issue 12, 1997, Pages 7726-7731

Surface-roughness fractality effects in electrical conductivity of single metallic and semiconducting films

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EID: 0001262149     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.56.7726     Document Type: Article
Times cited : (114)

References (44)
  • 1
    • 0004277028 scopus 로고
    • McGraw-Hill, New York
    • For a review, see K. L. Chopra, Thin Film Phenomena (McGraw-Hill, New York, 1969).
    • (1969) Thin Film Phenomena
    • Chopra, K.1
  • 14
    • 36049053545 scopus 로고
    • R. E. Prange and T.-W. Nee, Phys. Rev. 168, 779 (1968).
    • (1968) Phys. Rev. , vol.168 , pp. 779
    • Prange, R.1
  • 23
    • 85037912156 scopus 로고
    • 49, 5785(E) (1994).
    • (1994) , vol.49 , pp. 5785
  • 44
    • 85037883404 scopus 로고    scopus 로고
    • 53, R2956 (1996).
    • (1996) , vol.53 , pp. R2956


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.