SCOPUS 정보 검색 플랫폼

Volumn 88, Issue 26, 2006, Pages

Surface scanning probe microscopy investigation of solution deposited BiFeO3 thin films

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BISMUTH COMPOUNDS; DIELECTRIC PROPERTIES; ELECTROMAGNETIC WAVE POLARIZATION; MICROSCOPIC EXAMINATION; MICROSTRUCTURE; PEROVSKITE;

BIFEO3; FINE GRAINED THIN FILMS; MULTIFERROIC PEROVSKITE-TYPE OXIDE; POLARIZATION CHARACTERISTICS; SURFACE SCANNING PROBE MICROSCOPY;

THIN FILMS;

EID: 33745598297 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2212280 Document Type: Article

Times cited : (8)

References (12)

1
- 18844384296
- Yu. E. Roginskaya, Yu. N. Venevtsev, S. A. Fedulov, and G. S. Zhdanov, Sov. Phys. Crystallogr. 8, 490 (1964).
- (1964) Sov. Phys. Crystallogr. , vol.8 , pp. 490
- Roginskaya, Yu.E.¹ Venevtsev, Yu.N.² Fedulov, S.A.³ Zhdanov, G.S.⁴

2
- 18844404553
- S. V. Kiselev, A. N. Kshnyakina, R. P. Ozerov, and G. S. Zhdanov, Sov. Phys. Solid State 5, 2425 (1964).
- (1964) Sov. Phys. Solid State , vol.5 , pp. 2425
- Kiselev, S.V.¹ Kshnyakina, A.N.² Ozerov, R.P.³ Zhdanov, G.S.⁴

3
- 84943426657
- F. Kubel and H. Schmid, Acta Crystallogr., Sect. B: Struct. Sci. B46, 698 (1990).
- (1990) Acta Crystallogr., Sect. B: Struct. Sci. B , vol.46 , pp. 698
- Kubel, F.¹ Schmid, H.²

4
- 0037436499
- J. Wang, J. B. Neaton, H. Zheng, V. Nagarajan, S. B. Ogale, B. Liu, D. Viehland, V. Vaithyanathan, D. G. Schlom, U. V. Waghmare, N. A. Spaldin, K. M. Rabe, M. Wuttig, and R. Ramesh, Science 299, 1719 (2003).
- (2003) Science , vol.299 , pp. 1719
- Wang, J.¹ Neaton, J.B.² Zheng, H.³ Nagarajan, V.⁴ Ogale, S.B.⁵ Liu, B.⁶ Viehland, D.⁷ Vaithyanathan, V.⁸ Schlom, D.G.⁹ Waghmare, U.V.¹⁰ Spaldin, N.A.¹¹ Rabe, K.M.¹² Wuttig, M.¹³ Ramesh, R.¹⁴

5
- 24644449094
- S. J. Yang, F. Zavaliche, L. Mohaddes-Ardabili, V. Vaithyanathan, G. Schlom, Y. J. Lee, Y. H. Chu, M. P. Cruz, Q. Zhan, T. Zhao, and R. Ramesh, Appl. Phys. Lett. 87, 102903 (2005).
- (2005) Appl. Phys. Lett. , vol.87 , pp. 102903
- Yang, S.J.¹ Zavaliche, F.² Mohaddes-Ardabili, L.³ Vaithyanathan, V.⁴ Schlom, G.⁵ Lee, Y.J.⁶ Chu, Y.H.⁷ Cruz, M.P.⁸ Zhan, Q.⁹ Zhao, T.¹⁰ Ramesh, R.¹¹

6
- 28344446250
- Y.-H. Lee, J.-M. Wu, Y.-L. Chueh, and L.-J. Chou, Appl. Phys. Lett. 87. 172901 (2005).
- (2005) Appl. Phys. Lett. , vol.87 , pp. 172901
- Lee, Y.-H.¹ Wu, J.-M.² Chueh, Y.-L.³ Chou, L.-J.⁴

7
- 28944438549
- F. Tyholdt, S. Jørgensen, H. Fjellvåg, and A. E. Gunnæs, J. Mater. Res. 20, 2127 (2005).
- (2005) J. Mater. Res. , vol.20 , pp. 2127
- Tyholdt, F.¹ Jørgensen, S.² Fjellvåg, H.³ Gunnæs, A.E.⁴

8
- 21044447226
- A. K. Pradhan, K. Zhang, D. Hunter, J. B. Dadson, G. B. Loutts, P. Bhattacharya, R. Katiyar, J. Zhang, D. J. Sellmyer, U. N. Roy, Y. Cui, and A. Burger, Appl. Phys. Lett. 97, 093903 (2005).
- (2005) Appl. Phys. Lett. , vol.97 , pp. 093903
- Pradhan, A.K.¹ Zhang, K.² Hunter, D.³ Dadson, J.B.⁴ Loutts, G.B.⁵ Bhattacharya, P.⁶ Katiyar, R.⁷ Zhang, J.⁸ Sellmyer, D.J.⁹ Roy, U.N.¹⁰ Cui, Y.¹¹ Burger, A.¹²

9
- 18844441261
- S. Iakovlev, C.-H. Solterbeck, M. Kuhnke, and M. Es-Souni, J. Appl. Phys. 97, 094901 (2005).
- (2005) J. Appl. Phys. , vol.97 , pp. 094901
- Iakovlev, S.¹ Solterbeck, C.-H.² Kuhnke, M.³ Es-Souni, M.⁴

10
- 18744378644
- X. Qi, J. Dho, R. Tomov, M. G. Balmire, and J.-L. MacManus-Driscoll, Appl. Phys. Lett. 86, 062903 (2005).
- (2005) Appl. Phys. Lett. , vol.86 , pp. 062903
- Qi, X.¹ Dho, J.² Tomov, R.³ Balmire, M.G.⁴ MacManus-Driscoll, J.-L.⁵

11
- 27144434082
- S. Yakovlev, J. Zekonyte, C.-H. Solterbeck, and M. Es-Souni, Thin Solid Films 493, 24 (2005).
- (2005) Thin Solid Films , vol.493 , pp. 24
- Yakovlev, S.¹ Zekonyte, J.² Solterbeck, C.-H.³ Es-Souni, M.⁴

12
- 0031077611
- K. G. Brooks, R. D. Klissurska, P. Moeckli, and N. Setter, J. Mater. Res. 12, 531 (1997).
- (1997) J. Mater. Res. , vol.12 , pp. 531
- Brooks, K.G.¹ Klissurska, R.D.² Moeckli, P.³ Setter, N.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.