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Journal of Applied Physics

Volumn 103, Issue 12, 2008, Pages

Refractive indices and elasto-optic coefficients of GaN studied by optical waveguiding

(5) Pezzagna, S a,c Brault, J a Leroux, M a Massies, J a De Micheli, M b

a CNRS (France)

b UNIVERSITÉ CÔTE D'AZUR (France)

c RUHR UNIVERSITY BOCHUM (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BEAM EPITAXY; CLADDING (COATING); CRYSTAL GROWTH; CURVE FITTING; EPITAXIAL GROWTH; FILM GROWTH; FUNCTION EVALUATION; GALLIUM ALLOYS; GALLIUM NITRIDE; ION BEAM ASSISTED DEPOSITION; LIGHT MEASUREMENT; LIGHT REFRACTION; METALLIZING; METALLORGANIC CHEMICAL VAPOR DEPOSITION; METALS; MOLECULAR BEAMS; MOLECULAR DYNAMICS; NEON; OPTICAL PROPERTIES; ORGANIC CHEMICALS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; REFRACTIVE INDEX; REFRACTOMETERS; SEMICONDUCTING GALLIUM; VAPOR DEPOSITION; WASTEWATER; WAVEGUIDES;

1550 NM; AMERICAN INSTITUTE OF PHYSICS (AIP); BIAXIAL STRESSES; CLADDING LAYERS; FREE EXCITON (FX); IN PLANE STRESSES; LINEAR VARIATIONS; LOW TEMPERATURE (LTR); METAL-ORGANIC CHEMICAL VAPOR DEPOSITION (MOCVD); OPTICAL WAVEGUIDING; OPTICAL WAVELENGTHS; PRISM COUPLING METHODS; REFLECTIVITY MEASUREMENTS; SELLMEIER EQUATIONS; SPECTRAL DOMAINS; VISIBLE-WAVELENGTH RANGE;

MOLECULAR BEAM EPITAXY;

EID: 46449089065 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2947598 Document Type: Article

Times cited : (50)

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