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Volumn 331, Issue 1-2, 2004, Pages 117-124

The effect of stress distribution on dielectric properties of compositionally graded Ba1-xSrxTiO3 thin films

Author keywords

Compositionally graded BST thin films; Stress; Transverse field Ising model (TIM)

Indexed keywords

BARIUM COMPOUNDS; COMPRESSIVE STRESS; DIELECTRIC PROPERTIES OF SOLIDS; ISING MODEL; MEAN FIELD THEORY; STRESS CONCENTRATION; STRESSES; STRONTIUM COMPOUNDS; TENSILE STRESS; TITANIUM COMPOUNDS;

EID: 4644372757     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physleta.2004.08.033     Document Type: Article
Times cited : (10)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.