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Volumn 331, Issue 1-2, 2004, Pages 117-124
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The effect of stress distribution on dielectric properties of compositionally graded Ba1-xSrxTiO3 thin films
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Author keywords
Compositionally graded BST thin films; Stress; Transverse field Ising model (TIM)
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Indexed keywords
BARIUM COMPOUNDS;
COMPRESSIVE STRESS;
DIELECTRIC PROPERTIES OF SOLIDS;
ISING MODEL;
MEAN FIELD THEORY;
STRESS CONCENTRATION;
STRESSES;
STRONTIUM COMPOUNDS;
TENSILE STRESS;
TITANIUM COMPOUNDS;
BOTTOM SURFACES;
BST THIN FILMS;
DIELECTRIC SUSCEPTIBILITY;
DIELECTRIC TUNABILITY;
HIGH DIELECTRICS;
INTERFACE STRESS;
TEMPERATURE STABILITY;
TRANSVERSE-FIELD ISING MODEL;
THIN FILMS;
BARIUM DERIVATIVE;
ARTICLE;
CHEMICAL COMPOSITION;
CHEMICAL REACTION;
ELECTRICITY;
FILM;
MATHEMATICAL MODEL;
STRESS;
TENSILE STRENGTH;
THEORETICAL MODEL;
THERMOSTABILITY;
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EID: 4644372757
PISSN: 03759601
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physleta.2004.08.033 Document Type: Article |
Times cited : (10)
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References (19)
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