Compositionally graded BaxSr1-xTiO3 thin films for tunable microwave applications

Materials Chemistry and Physics

Volumn 79, Issue 2-3, 2003, Pages 157-160

  Adikary, S U ^a   Chan, H L W ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

Barium strontium titanate; Dielectric constant; Tunability

Indexed keywords

ATOMIC FORCE MICROSCOPY; BARIUM TITANATE; DIELECTRIC LOSSES; DYNAMIC RANDOM ACCESS STORAGE; MICROELECTRONICS; MICROWAVE DEVICES; MORPHOLOGY; PERMITTIVITY; PEROVSKITE; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTOR MATERIALS; SOL-GELS; STRUCTURE (COMPOSITION); X RAY DIFFRACTION ANALYSIS;

COMPOSITIONAL GRADIENTS; TUNABILITY;

THIN FILMS;

EID: 0037431107     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(02)00255-9     Document Type: Article

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