메뉴 건너뛰기




Volumn 35 A, Issue 8, 2004, Pages 2229-2238

Defect structures in cosputtered thin films of transition-metal disilicides with C11b, C40 and C54 structures

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL DEFECTS; CRYSTAL ORIENTATION; MOLYBDENUM COMPOUNDS; MORPHOLOGY; SPUTTERING; STOICHIOMETRY; TANTALUM COMPOUNDS; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; TWINNING;

EID: 4644360268     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-006-0202-z     Document Type: Article
Times cited : (1)

References (36)
  • 32
    • 0012755014 scopus 로고    scopus 로고
    • M. Shiojiri and N. Nishio, eds., Japanese Society of Electron Microscopy, Tokyo, Software available from HREM Research Inc
    • K. Ishizuka: Proc. Int. Symp. on Hybrid Analyses for Functional Nanostructure, M. Shiojiri and N. Nishio, eds., Japanese Society of Electron Microscopy, Tokyo, 1998, p. 69. Software available from HREM Research Inc. (www.hremresearch.com).
    • (1998) Proc. Int. Symp. on Hybrid Analyses for Functional Nanostructure , pp. 69
    • Ishizuka, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.