SCOPUS 정보 검색 플랫폼

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 56, Issue 11, 2001, Pages 2049-2056

Laboratory and synchrotron radiation total-reflection X-ray fluorescence: New perspectives in detection limits and data analysis

(5) Baur, K a Brennan, S a Burrow, B b Werho, D c Pianetta, P a

a SLAC NATIONAL ACCELERATOR LABORATORY (United States)

b Accurel Systemsy (United States)

c MOTOROLA INC (United States)

Author keywords

Low Z elements; Stanford Synchrotron Radiation Laboratory; Total reflection X ray fluorescence

Indexed keywords

EXCITATION ENERGY;

ACTIVATION ENERGY; DATA REDUCTION; ELECTROMAGNETIC WAVE REFLECTION; FLUORESCENCE; IMPURITIES; RAMAN SCATTERING; SYNCHROTRON RADIATION; X RAY SCATTERING;

X RAY ANALYSIS;

EID: 0035976278 PISSN: 05848547 EISSN: None Source Type: Journal
DOI: 10.1016/S0584-8547(01)00324-X Document Type: Article

Times cited : (17)

References (18)

1
- 0034262483
- (2000) Thin Solid Films , vol.373 , pp. 222-226
- Pianetta, P.¹ Baur, K.² Singh, A.³ Brennan, S.⁴ Kerner, J.⁵ Werho, D.⁶ Wang, J.⁷

2
- 0000709164
- (1995) Rev. Sci. Instrum. , vol.66 , pp. 1293-1297
- Pianetta, P.¹ Takaura, N.² Brennan, S.³ Tompkins, W.⁴ Laderman, S.S.⁵ Fischer-Colbrie, A.⁶ Shimazaki, A.⁷ Miyazaki, K.⁸ Madden, M.⁹ Wherry, D.C.¹⁰ Kortright, J.B.¹¹

3
- 0033515145
- (1999) Nucl. Instrum. Meth. B , vol.150 , pp. 538-542
- Comin, F.¹ Navizet, M.² Mangiagalli, P.³ Apostolo, G.⁴

4
- 0003666676
- S.M. Mini, D.L. Perry, S.R. Stock, L.J. Terminello (Eds.), MRS, Boston
- (1998) Application of Synchrotron Radiation Techniques to Materials Science IV , vol.542
- Brennan, S.¹ Pianetta, P.² Gosh, S.³ Takaura, N.⁴ Wiemer, C.⁵ Fischer-Colbrie, A.⁶ Laderman, S.⁷ Shimazaki, A.⁸ Waldhauer, A.⁹ Zaitz, M.A.¹⁰

5
- 0033327726
- (1999) Spectrochim. Acta Part B , vol.54 , pp. 1433-1441
- Streli, C.¹ Kregsamer, P.² Wobrauschek, P.³ Gatterbauer, H.⁴ Pianetta, P.⁵ Pahlke, S.⁶ Fabry, L.⁷ Palmetshofer, L.⁸ Schmeling, M.⁹

6
- 0001397801
- (2000) J. Appl. Phys. , vol.88 , pp. 4642-4647
- Baur, K.¹ Kerner, J.² Brennan, S.³ Singh, A.⁴ Pianetta, P.⁵

7
- 84996540376
- United States Patent 5732120, March 1998

8
- 0001071444
- (1997) Adv. X-Ray Anal. , vol.39 , pp. 781
- Fukuda, T.¹ Shoji, T.² Funabashi, M.³ Utaka, T.⁴ Arai, T.⁵ Miyazaki, K.⁶ Shimazaki, A.⁷ Wilson, R.⁸

9
- 0031165143
- (1997) Spectrochim. Acta Part B , vol.52 , pp. 861-872
- Streli, C.¹

10
- 0000207366
- (1974) Phys. Rev. Lett. , vol.33 , pp. 262-266
- Sparks, C.J.¹

11
- 0002142258
- (1999) Phys. Rep. , vol.312 , pp. 87
- Gel'mukhanov, F.¹ Agren, H.²

12
- 0000093963
- (1976) Phys. Rev. Lett. , vol.36 , pp. 623-626
- Eisenberger, P.¹ Platzman, P.M.² Winick, H.³

13
- 0001443411
- (1995) Adv. X-ray Chem. Anal. Jpn. , vol.26 S , pp. 113
- Takaura, N.¹ Brennan, S.² Pianetta, P.³ Laderman, S.⁴ Fischer-Colbrie, A.⁵ Kortright, J.B.⁶ Wherry, D.C.⁷ Miyazaki, K.⁸ Shimazaki, A.⁹

14
- 0003689657
- Plenum Press, New York
- (1975) Principles and Practice of X-Ray Spectrometric Analysis
- Bertin, E.P.¹

15
- 0001633444
- (1975) Rev. Roum. Phys. , vol.20 , pp. 209-230
- Gavrila, M.¹ Tugulea, M.N.²

16
- 0000887515
- (1974) Rev. Roum. Phys. , vol.19 , pp. 473-487
- Gavrila, M.¹

17
- 0001360805
- (1996) Phys. Rev. , vol.B53 , pp. 809-817
- Verhoeve, P.¹ Rando, N.² Verveer, J.³ Peacock, A.⁴ Van Dordrecht, A.⁵ Videler, P.⁶ Bavdaz, M.⁷ Goldie, D.J.⁸ Lederer, T.⁹ Scholze, F.¹⁰ Ulm, G.¹¹ Venn, R.¹²

18
- 0033733204
- (2000) Nucl. Instrum. Meth. , vol.A444 , pp. 151-155
- Friedrich, S.¹ Cunningham, M.F.² Frank, M.³ Labov, S.E.⁴ Barfknecht, A.T.⁵ Cramer, S.P.⁶

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.